Stolní rentgenový difraktometr EUROPE

Difraktometr EUROPE je stolní difraktometr s geometrií Theta / 2Theta, určený pro obecné účely na rentgenovou kvalitativní a kvantitativní analýzy polykrystalických materiálů. 

Jeho kompaktní rozměry a robustní design umožňují jeho instalaci a provoz v malém prostoru s nízkými náklady na provoz a údržbu. 

Difraktometr EUROPE je možné doplnit o scintilační detektor, sekundární monochromátor nebo vícenásobný držák vzorků. 

EUROPE je ideální nástroj pro rychlé a rutinní analýzy zabezpečování jakosti v průmyslu, ale i pro výuku XRD na akademické úrovni.

Technické parametry
 

X-Ray Generator	Maximum Output Power	600 W (option: 300 W)
	Output Stability	≤25ppm/hr after a 2 hour warm up
	Max Output Voltage	40 kV (option: 30 kV)
	Max Output Current	15 mA (option: 10 mA)
	Voltage Step Width	0.1 kV
	Current Step Width	0.1 mA
	Ripple	≤1%rms at >20 kHz, 0.1%rms below 20 kHz
	Preheat and Ramp	Automatic preheat and ramp control circuit
	Input Voltage	230 Vac +/-10%, 50 or 60 Hz, single phase
X-Ray Tube	Type	Glass (option: Ceramic), Cu Anode, Fine Focus (options: any kind of X-Ray tube)
	Focus	0.4 x 8 mm LFF (other options available)
	Max Output	600 kW
Goniometer	Configurations	Vertical Theta/2Theta geometry
	Measuring circle diameters	150 mm
	Vertical Scanning Angular Range	- 5° < 2 Theta < + 145° (according to accessories)
	Smallest selectable stepsize	0.005°
	Angular reproducibility	+/- 0.001°
	Accuracy	+/- 0.01
	Modes of operation	Continuous scan, step scan, theta or 2 theta scan, fast scan
	Variable Divergence slits	0 - 4°
	Variable Anti-Divergence slits	0 - 4°
	Variable Receiver slits	0 - 4°
	Soller slits	2.3°
Detector	Type	Scintillation counter Nal (options: YAP(Ce); multistrip)
	Count rate	10(5) cps (Nal); 2 x 10(7) cps (Yap(Ce))
Case	Dimensions	Width 600 mm, heigh 750 mm, depth 500 mm
	Weight	130 kg
	Leakage X-rays	< 1 mSv/Year (full safety shielding according to the international guidelines)
Processing Unit	Computer Type	Personal Computer, the latest version
	Items controlled	X-ray generator, goniometer, sample holder, detector
	Basic Data Processing	Polynomial least squares smoothing. Fourier smoothing. Search for Peaks (automatic and manual). Spline background subtraction. Single peak analysis (area, FWHM, centroid, background). Marquardt fit (with pseudo-Voigt and Pearson VII curves, Ka2 contribution, weighted sum of squares). Sum and multiply by a constant. Scale normalization. Zoom. Graphical windows. Overlap and comparison of diffractograms. Multiview function. Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples. Qualitative and quantitative phase analysis. Rietveld analysis, crystalline structural analysis, crystallite size and lattice strain, crystallinity calculation