X Ray Generator | Maximum Output Power | 3 kW (option: 4 kW) |
Output Stability | < 0.01 % (for 10% power supply fluctuation) |
Max Output Voltage | 60 kV |
Max Output Current | 60 mA (option: 80 mA) |
Voltage Step Width | 0.1 kV |
Current Step Width | 0.1 mA |
Ripple | 0.03% rms < 1kHz, 0.75% rms > 1kHz |
Preheat and Ramp | Automatic preheat and ramp control circuit |
Input Voltage | 220 Vac +/-10%, 50 or 60 Hz, single phase |
Size | Width 48.3 cm, height 13.3 cm, depth 56 cm |
X-Ray Tube | Type | Glass (option: Ceramic), Cu Anode, Fine Focus (options: any kind of X-Ray tube) |
Focus | 0.4 x 12 mm LFF (other options available) |
Max Output | 3.0 kW |
Goniometer | Configurations | Vertical and Horizontal Theta/2Theta geometry |
Measuring circle diameters | 350 - 400 mm |
Vertical Scanning Angular Range | - 60° < 2 Theta < + 168° (according to accessories) |
Horizontal Scanning Angular Range | - 110° < 2 Theta < + 168° (according to accessories) |
Smallest selectable stepsize | 0.0001° |
Angular reproducibility | +/- 0.0001° |
Modes of operation | Continuous scan, step scan, theta or 2 theta scan, fast scan, theta axis oscillation |
Variable Divergence slits | 0 - 4° |
Variable Anti-Divergence slits | 0 - 4° |
Variable Receiver slits | 0 - 4° |
Soller slits | 2° |
Detector | Type | Scintillation counter Nal (options: YAP(Ce); multistrip) |
Countrate | 2 x 10(6) cps (Nal); 2 x 10(7) cps (Yap(Ce)) |
Case | Dimensions | Width 850 mm, heigh 1680 mm, depth 750 mm |
Leakage X-rays | < 1 mSv/Year (full safety shielding according to the international guidelines) |
Processing Unit | Computer Type | Personal Computer, the latest version |
Items controlled | X-ray generator, goniometer, sample holder, detector, counting chain |
Basic Data Processing | Polynomial least squares smoothing. Fourier smoothing. Search for Peaks (automatic and manual). Spline background subtraction. Single peak analysis (area, FWHM, centroid, background). Marquardt fit (with pseudo-Voigt and Pearson VII curves, Ka2 contribution, weighted sum of squares). Sum and multiply by a constant. Scale normalization. Zoom. Graphical windows. Overlap and comparison of diffractograms. Multiview function. Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples. Qualitative and quantitative phase analysis. Rietveld analysis, crystalline structural analysis, crystallite size and lattice strain, crystallinity calculation |